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"Analysis of the Power Outage Effects in RFID."

Javier Vales-Alonso et al. (2017)

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DOI: 10.1109/LCOMM.2016.2622258

access: closed

type: Journal Article

metadata version: 2020-12-29

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  - journals/icl/Vales-AlonsoMAG17
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  - https://dblp.org/rec/journals/icl/Vales-AlonsoMAG17
Javier Vales-Alonso, Juan Pedro Muñoz-Gea, Juan J. Alcaraz, Francisco Javier González-Castaño:
Analysis of the Power Outage Effects in RFID. IEEE Commun. Lett. 21(1): 306-309 (2017)

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