"Enhancing the Expected Lifetime of NAND Flash by Short q-Ary WOM Codes."

Bing Fan, Minghai Qin, Paul H. Siegel (2018)

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DOI: 10.1109/LCOMM.2017.2776200

access: closed

type: Journal Article

metadata version: 2020-08-20

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Bing Fan, Minghai Qin, Paul H. Siegel:
Enhancing the Expected Lifetime of NAND Flash by Short q-Ary WOM Codes. IEEE Commun. Lett. 22(7): 1302-1305 (2018)

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