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"Large-Area Fault Clusters and Fault Tolerance in VLSI Circuits: A Review."

Charles H. Stapper (1989)

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DOI: 10.1147/RD.332.0162

access: closed

type: Journal Article

metadata version: 2020-03-13

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  - journals/ibmrd/Stapper89
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Charles H. Stapper:
Large-Area Fault Clusters and Fault Tolerance in VLSI Circuits: A Review. IBM J. Res. Dev. 33(2): 162-173 (1989)

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