"Modeling of Integrated Circuit Defect Sensitivities."

Charles H. Stapper (1983)

> Home

Details and statistics

DOI: 10.1147/RD.276.0549

access: closed

type: Journal Article

metadata version: 2020-03-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ibmrd/Stapper83
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ibmrd/Stapper83
Charles H. Stapper:
Modeling of Integrated Circuit Defect Sensitivities. IBM J. Res. Dev. 27(6): 549-557 (1983)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.