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"Field testing for cosmic ray soft errors in semiconductor memories."
Timothy J. O'Gorman et al. (1996)
- Timothy J. O'Gorman, John M. Ross, Allen H. Taber, James F. Ziegler, Hans P. Muhlfeld, Charles J. Montrose, Huntington W. Curtis, James L. Walsh:
Field testing for cosmic ray soft errors in semiconductor memories. IBM J. Res. Dev. 40(1): 41-50 (1996)
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