"A CMOS LSSD Test Generation System."

D. Leet, P. Shearon, R. France (1984)

> Home

Details and statistics

DOI: 10.1147/RD.285.0625

access: closed

type: Journal Article

metadata version: 2020-03-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ibmrd/LeetSF84
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ibmrd/LeetSF84
D. Leet, P. Shearon, R. France:
A CMOS LSSD Test Generation System. IBM J. Res. Dev. 28(5): 625-635 (1984)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.