"Head reliability of AMR sensors based on thermal stress tests."

Icko Eric Timothy Iben (2003)

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DOI: 10.1147/RD.474.0415

access: closed

type: Journal Article

metadata version: 2020-03-13

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Icko Eric Timothy Iben:
Head reliability of AMR sensors based on thermal stress tests. IBM J. Res. Dev. 47(4): 415-428 (2003)

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