"High-performance CMOS variability in the 65-nm regime and beyond."

Kerry Bernstein et al. (2006)

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DOI: 10.1147/RD.504.0433

access: closed

type: Journal Article

metadata version: 2020-03-13

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Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer:
High-performance CMOS variability in the 65-nm regime and beyond. IBM J. Res. Dev. 50(4-5): 433-450 (2006)

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