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"A probabilistic approach to building defect prediction model for ..."

Chang-Kyun Jeon, Neunghoe Kim, Hoh In (2017)

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DOI: —

access: open

type: Journal Article

metadata version: 2024-01-26

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Chang-Kyun Jeon, Neunghoe Kim, Hoh In:
A probabilistic approach to building defect prediction model for platform-based product lines. Int. Arab J. Inf. Technol. 14(4): 413-422 (2017)

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