"Analysis of the soft error susceptibility and failure rate in logic circuits."

Eman AlQuraishi, May Al-Roomi, Sobeeh Almukhaizim (2011)

> Home

Details and statistics

DOI: —

access: closed

type: Journal Article

metadata version: 2023-03-16

- view
  - electronic edition @ iajit.org (archived)
- export record
  dblp key:
  - journals/iajit/AlQuraishiAA11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/iajit/AlQuraishiAA11
Eman AlQuraishi, May Al-Roomi, Sobeeh Almukhaizim:
Analysis of the soft error susceptibility and failure rate in logic circuits. Int. Arab J. Inf. Technol. 8(4): 388-396 (2011)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.