default search action
"Detecting Faults in Inner Product Masking Scheme - IPM-FD: IPM with Fault ..."
Wei Cheng et al. (2019)
- Wei Cheng, Claude Carlet, Kouassi Goli, Sylvain Guilley, Jean-Luc Danger:
Detecting Faults in Inner Product Masking Scheme - IPM-FD: IPM with Fault Detection. IACR Cryptol. ePrint Arch. 2019: 919 (2019)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.