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"Radiation-induced Soft Errors: A Chip-level Modeling Perspective."

Norbert Seifert (2010)

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DOI: 10.1561/1000000018

access: closed

type: Journal Article

metadata version: 2020-06-18

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Norbert Seifert:
Radiation-induced Soft Errors: A Chip-level Modeling Perspective. Found. Trends Electron. Des. Autom. 4(2-3): 99-221 (2010)

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