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"Expected affine: A registration method for damaged section in serial ..."

Tong Xin et al. (2022)

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DOI: 10.3389/FNINF.2022.944050

access: open

type: Journal Article

metadata version: 2023-05-08

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Tong Xin, Lijun Shen, Linlin Li, Xi Chen, Hua Han:
Expected affine: A registration method for damaged section in serial sections electron microscopy. Frontiers Neuroinformatics 16 (2022)

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