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"Evaluating the safety of self-checking circuits."

Shujian Zhang, Jon C. Muzio (1995)

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DOI: 10.1007/BF00993090

access: closed

type: Journal Article

metadata version: 2020-09-11

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Shujian Zhang, Jon C. Muzio:
Evaluating the safety of self-checking circuits. J. Electron. Test. 6(2): 243-253 (1995)

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