"A Novel Approach for Analog Circuit Fault Prognostics Based on Improved RVM."

Chaolong Zhang et al. (2014)

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DOI: 10.1007/S10836-014-5454-8

access: closed

type: Journal Article

metadata version: 2023-07-10

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Chaolong Zhang, Yigang He, Lifen Yuan, Fangming Deng:
A Novel Approach for Analog Circuit Fault Prognostics Based on Improved RVM. J. Electron. Test. 30(3): 343-356 (2014)

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