"The Coupling Model for Function and Delay Faults."

Joonhwan Yi, John P. Hayes (2005)

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DOI: 10.1007/S10836-005-3476-Y

access: closed

type: Journal Article

metadata version: 2020-09-11

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Joonhwan Yi, John P. Hayes:
The Coupling Model for Function and Delay Faults. J. Electron. Test. 21(6): 631-649 (2005)

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