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"Multiple Retest Systems for Screening High-Quality Chips."

Chung-Huang Yeh, Jwu E. Chen (2023)

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DOI: 10.1007/S10836-023-06051-0

access: closed

type: Journal Article

metadata version: 2023-07-13

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Chung-Huang Yeh, Jwu E. Chen:
Multiple Retest Systems for Screening High-Quality Chips. J. Electron. Test. 39(2): 207-225 (2023)

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