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"Test Points Selection for Analog Fault Dictionary Techniques."

Chenglin Yang, Shulin Tian, Bing Long (2009)

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DOI: 10.1007/S10836-008-5097-8

access: closed

type: Journal Article

metadata version: 2020-09-11

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Chenglin Yang, Shulin Tian, Bing Long:
Test Points Selection for Analog Fault Dictionary Techniques. J. Electron. Test. 25(2-3): 157-168 (2009)

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