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"Model Transferability from ImageNet to Lithography Hotspot Detection."

Yindong Xiao, XueQian Huang, Ke Liu (2021)

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DOI: 10.1007/S10836-021-05925-5

access: closed

type: Journal Article

metadata version: 2021-07-13

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Yindong Xiao, XueQian Huang, Ke Liu:
Model Transferability from ImageNet to Lithography Hotspot Detection. J. Electron. Test. 37(1): 141-149 (2021)

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