"Process Deviations and Spot Defects: Two Aspects of Test and Test ..."

Carsten Wegener, Michael Peter Kennedy, Bernd Straube (2001)

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DOI: 10.1023/A:1012703202816

access: closed

type: Journal Article

metadata version: 2020-09-11

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Carsten Wegener, Michael Peter Kennedy, Bernd Straube:
Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits. J. Electron. Test. 17(5): 409-416 (2001)

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