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"Built-in Self-test and Defect Tolerance in Molecular Electronics-based ..."

Zhanglei Wang, Krishnendu Chakrabarty (2007)

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DOI: 10.1007/S10836-006-0550-Z

access: closed

type: Journal Article

metadata version: 2022-01-03

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Zhanglei Wang, Krishnendu Chakrabarty:
Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. J. Electron. Test. 23(2-3): 145-161 (2007)

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