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"Enhanced Reduced Pin-Count Test for Full-Scan Design."
Harald P. E. Vranken et al. (2002)
- Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier:
Enhanced Reduced Pin-Count Test for Full-Scan Design. J. Electron. Test. 18(2): 129-143 (2002)
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