"A Framework for Configurable Joint-Scan Design-for-Test Architecture."

Jaynarayan T. Tudu et al. (2021)

> Home

Details and statistics

DOI: 10.1007/S10836-021-05978-6

access: closed

type: Journal Article

metadata version: 2022-02-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/TuduASS21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/TuduASS21
Jaynarayan T. Tudu, Satyadev Ahlawat, Sonali Shukla, Virendra Singh:
A Framework for Configurable Joint-Scan Design-for-Test Architecture. J. Electron. Test. 37(5): 593-611 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.