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"Test Data Compression Using Multi-dimensional Pattern Run-length Codes."

Wang-Dauh Tseng, Lung-Jen Lee (2010)

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DOI: 10.1007/S10836-009-5138-Y

access: closed

type: Journal Article

metadata version: 2020-09-11

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Wang-Dauh Tseng, Lung-Jen Lee:
Test Data Compression Using Multi-dimensional Pattern Run-length Codes. J. Electron. Test. 26(3): 393-400 (2010)

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