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"Tester Memory Requirements and Test Application Time Reduction for Delay ..."

Claude Thibeault, Yassine Hariri, Christelle Hobeika (2012)

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DOI: 10.1007/S10836-011-5271-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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Claude Thibeault, Yassine Hariri, Christelle Hobeika:
Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors. J. Electron. Test. 28(2): 229-242 (2012)

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