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"Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak ..."

Luca Testa et al. (2010)

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DOI: 10.1007/S10836-010-5154-Y

access: closed

type: Journal Article

metadata version: 2023-09-30

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Luca Testa, Hervé Lapuyade, Yann Deval, Jean-Louis Carbonéro, Jean-Baptiste Bégueret:
Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors. J. Electron. Test. 26(3): 355-365 (2010)

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