"A Reliability Statistics Perspective on the Pitfalls of Standard ..."

Cher Ming Tan, Kelvin Ngan Chong Yeo (2001)

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DOI: 10.1023/A:1011102127642

access: closed

type: Journal Article

metadata version: 2020-09-11

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Cher Ming Tan, Kelvin Ngan Chong Yeo:
A Reliability Statistics Perspective on the Pitfalls of Standard Wafer-Level Electromigration Accelerated Test (SWEAT). J. Electron. Test. 17(1): 63-68 (2001)

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