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"Transient power supply current monitoring - A new test method for CMOS ..."

Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle (1995)

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DOI: 10.1007/BF00993128

access: closed

type: Journal Article

metadata version: 2020-11-13

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Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle:
Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electron. Test. 6(1): 23-43 (1995)

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