"Partial scan and symbolic test at the register-transfer level."

Johannes Steensma, Francky Catthoor, Hugo De Man (1995)

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DOI: 10.1007/BF00993311

access: closed

type: Journal Article

metadata version: 2020-09-11

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Johannes Steensma, Francky Catthoor, Hugo De Man:
Partial scan and symbolic test at the register-transfer level. J. Electron. Test. 7(1-2): 7-23 (1995)

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