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"A Reliability-Aware Methodology to Isolate Timing-Critical Paths under Aging."

Ankush Srivastava et al. (2017)

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DOI: 10.1007/S10836-017-5692-7

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/SrivastavaSSS17
Ankush Srivastava, Virendra Singh, Adit D. Singh, Kewal K. Saluja:
A Reliability-Aware Methodology to Isolate Timing-Critical Paths under Aging. J. Electron. Test. 33(6): 721-739 (2017)

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