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"Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing."

Suraj Sindia, Vishwani D. Agrawal, Virendra Singh (2012)

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DOI: 10.1007/S10836-012-5305-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Suraj Sindia, Vishwani D. Agrawal, Virendra Singh:
Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing. J. Electron. Test. 28(4): 541-549 (2012)

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