"A Simulated Annealing Inspired Test Optimization Method for Enhanced ..."

Yiwen Shi, Jennifer Dworak (2013)

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DOI: 10.1007/S10836-013-5357-0

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yiwen Shi, Jennifer Dworak:
A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects. J. Electron. Test. 29(3): 275-288 (2013)

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