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"ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus."

Xiaoqin Sheng et al. (2012)

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DOI: 10.1007/S10836-012-5309-0

access: closed

type: Journal Article

metadata version: 2020-09-11

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  dblp key:
  - journals/et/ShengKZG12
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  - https://dblp.org/rec/journals/et/ShengKZG12
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud:
ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus. J. Electron. Test. 28(4): 393-404 (2012)

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