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"Yield enhancement and manufacturing throughput of redundant memories by ..."

Yinan N. Shen, Fabrizio Lombardi (1990)

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DOI: 10.1007/BF00134014

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yinan N. Shen, Fabrizio Lombardi:
Yield enhancement and manufacturing throughput of redundant memories by repairability/unrepairability detection. J. Electron. Test. 1(1): 43-57 (1990)

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