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ORCID"LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects."
Krishna Sekar, Sujit Dey (2003)
- Krishna Sekar, Sujit Dey:
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects. J. Electron. Test. 19(2): 113-123 (2003)
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