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"Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger."

Yoichi Sasaki, Kazuteru Namba, Hideo Ito (2008)

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DOI: 10.1007/S10836-007-5034-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yoichi Sasaki, Kazuteru Namba, Hideo Ito:
Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger. J. Electron. Test. 24(1-3): 11-19 (2008)

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