"Design of a C-testable booth multiplier using a realistic fault model."

Jos van Sas et al. (1994)

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DOI: 10.1007/BF00971961

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - journals/et/SasNPCVM94
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  - https://dblp.org/rec/journals/et/SasNPCVM94
Jos van Sas, Chay Nowé, Didier Pollet, Francky Catthoor, Paul Vanoostende, Hugo De Man:
Design of a C-testable booth multiplier using a realistic fault model. J. Electron. Test. 5(1): 29-41 (1994)

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