"On-Chip Pseudorandom MEMS Testing."

Libor Rufer et al. (2005)

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DOI: 10.1007/S10836-005-6353-9

access: closed

type: Journal Article

metadata version: 2020-09-11

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Libor Rufer, Salvador Mir, Emmanuel Simeu, C. Domingues:
On-Chip Pseudorandom MEMS Testing. J. Electron. Test. 21(3): 233-241 (2005)

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