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"Detection of Defects Using Fault Model Oriented Test Sequences."

Michel Renovell, Florence Azaïs, Yves Bertrand (1999)

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DOI: 10.1023/A:1008336919671

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/RenovellAB99
Michel Renovell, Florence Azaïs, Yves Bertrand:
Detection of Defects Using Fault Model Oriented Test Sequences. J. Electron. Test. 14(1-2): 13-22 (1999)

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