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"Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield ..."

Ahmed Amine Rekik et al. (2014)

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DOI: 10.1007/S10836-013-5423-7

access: closed

type: Journal Article

metadata version: 2024-02-05

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  - https://dblp.org/rec/journals/et/RekikAMN14
Ahmed Amine Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet:
Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers. J. Electron. Test. 30(1): 87-100 (2014)

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