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"Hierarchical Delay Test Generation."

C. P. Ravikumar, Nitin Agrawal, Parul Agarwal (1997)

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DOI: 10.1023/A:1008267608838

access: closed

type: Journal Article

metadata version: 2020-09-11

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C. P. Ravikumar, Nitin Agrawal, Parul Agarwal:
Hierarchical Delay Test Generation. J. Electron. Test. 10(3): 231-244 (1997)

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