"Efficient Fault Detection by Test Case Prioritization via Test Case Selection."

J. Paul Rajasingh, P. Senthil Kumar, S. Srinivasan (2023)

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DOI: 10.1007/S10836-023-06086-3

access: closed

type: Journal Article

metadata version: 2024-02-04

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J. Paul Rajasingh, P. Senthil Kumar, S. Srinivasan:
Efficient Fault Detection by Test Case Prioritization via Test Case Selection. J. Electron. Test. 39(5): 659-677 (2023)

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