"EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement."

Jean-Michel Portal, Hassen Aziza, Didier Née (2005)

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DOI: 10.1007/S10836-005-5285-8

access: closed

type: Journal Article

metadata version: 2021-12-24

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Jean-Michel Portal, Hassen Aziza, Didier Née:
EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement. J. Electron. Test. 21(1): 33-42 (2005)

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