"Scalable Delay Fault BIST for Use with Low-Cost ATE."

Ilia Polian, Bernd Becker (2004)

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DOI: 10.1023/B:JETT.0000023681.25483.59

access: closed

type: Journal Article

metadata version: 2023-03-21

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Ilia Polian, Bernd Becker:
Scalable Delay Fault BIST for Use with Low-Cost ATE. J. Electron. Test. 20(2): 181-197 (2004)

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