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"Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal ..."

Konstantin O. Petrosyants et al. (2017)

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DOI: 10.1007/S10836-016-5635-8

access: closed

type: Journal Article

metadata version: 2020-09-11

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Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov:
Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model. J. Electron. Test. 33(1): 37-51 (2017)

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