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"Impact of Body Bias on Delay Fault Testing of Sub-100 nm CMOS Circuits."
Bipul C. Paul, Kaushik Roy (2006)
- Bipul C. Paul, Kaushik Roy:
Impact of Body Bias on Delay Fault Testing of Sub-100 nm CMOS Circuits. J. Electron. Test. 22(2): 115-124 (2006)

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