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"Parity bit calculation and test signal compaction for BIST applications."

Sungju Park, Sheldon B. Akers (1992)

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DOI: 10.1007/BF00159830

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/ParkA92
Sungju Park, Sheldon B. Akers:
Parity bit calculation and test signal compaction for BIST applications. J. Electron. Test. 3(1): 45-52 (1992)

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