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"IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors."

André K. Nieuwland, Richard P. Kleihorst (2004)

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DOI: 10.1023/B:JETT.0000042517.30698.AD

access: closed

type: Journal Article

metadata version: 2020-09-11

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André K. Nieuwland, Richard P. Kleihorst:
IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors. J. Electron. Test. 20(5): 533-542 (2004)

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