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"Reducing Test Time Using an Enhanced RF Loopback."
Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin (2007)
- Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin:
Reducing Test Time Using an Enhanced RF Loopback. J. Electron. Test. 23(6): 613-623 (2007)
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