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"Probabilistic fault grading based on activation checking and observability ..."

Masahisa Nakazawa, Susumu Nitta, Kanji Hirabayashi (1990)

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DOI: 10.1007/BF00153861

access: closed

type: Journal Article

metadata version: 2020-09-11

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Masahisa Nakazawa, Susumu Nitta, Kanji Hirabayashi:
Probabilistic fault grading based on activation checking and observability analysis. J. Electron. Test. 1(3): 235-238 (1990)

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